The TSIS is a fully integrated TTOC-II
controller option that automatically and
accurately determines tire sidewall undulation,
lateral runout, bulges and depressions
within the normal tire test cycle.
The TSIS is production
proven, having tested tire sidewalls
for over 20 years--initially with capacitive
probes and later with the improved resolution
and accuracy of laser triangulation.
The latest TSIS (version
3.0) incorporates CTI's advanced testing
algorithm that uses complex mathematics
and the three dimensional view of the
sidewall provided by multi-path testing
to locate bulges in regions containing
letters.
Designed to improve
sidewall defect detection and reduce
false rejects, the TSIS achieves both
goals. It has a reasonable deployment
cost and it does not add any machine
cycle time |
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